International Conference
on
Modern Electronics Devices and Intelligent Communication Systems
(MEDCOM 2025)

11th - 13th December, 2025
(Technically Co-Sponsored by IEEE- Computational Intelligence Society)
IEEE Conference Record No. #67532

Technical Program Committee

  • Prof. Madhu Khurana, Lecturer in cyber Security, University of Gloucestershire, UK
  • Dr. S. K Dubey, Scientist, Apex Level Standards & Industrial Metrology, CSIR-National Physical Laboratory, India
  • Dr. Arun Kumar Singh, Associate Professor, Department of Electrical Engineering, Indian Institute of Technology Jodhpur (IITJ)
  • Dr. Sandeep Kumar, Associate Professor, JNU, India
  • Dr. Mukesh Kumar Khandelwal, Associate Professor, DTU, India
  • Mr. Virendra Kumar, DRDO, Bengaluru
  • Dr. Rajesh Singh, Prof and Director, Division of Research and Development, Uttaranchal university
  • Dr. Zafaryab Rasool, Associate Research Fellow, Deakin University, Geelong, Victoria, Australia
  • Dr. Ajit Kumar, School of Computer Science and Engineering, Soongsil University, Seoul, South Korea
  • Mr. Aman Abidi, PhD Candidate, Swinburne University of Technology, Melbourne, Victoria, Australia
  • Dr. Sachin Kumar, Research Professor, College of IT Engineering, Kyungpook National University, Daegu, South Korea
  • Prof. Rajeev Tripathi, Professor MNNIT Allahabad
  • Prof. R.A. Mishra, Professor and HoD MNNIT Allahabad
  • Prof. V.S Tripathi, Professor MNNIT Allahabad
  • Sagar Naik, Professor, Dept. of Electrical and Computer Engineering, University of Waterloo, Canada
  • Dr. Ajay Kumar Poddar, Chief Scientist, Synergy Microwave Corporation, 201 McLean Boulevard, NJ07504, USA.
  • Dr. Hemant Purohit, Instructor and GSA, Department of Electrical Engineering and Computer Science Florida Institute of Technology, Melbourne, Florida, USA 32901
  • Dr. Badrul Hisham Ahmad, Professor, Faculty of Electronics and Computer Engineering, Center for Telecommunication Research & Innovation (CeTRI), Universiti Teknical Malaysia Melaka (UTeM), Melaka 76100, Malaysia
  • Dr. Akhilesh Mohan, Professor, Indian Institute of Technology, Roorkee
  • Dr. Shantanu Saha, Ohio State University, USA
  • Dr. Hemant Ghadi, Ohio State University, USA
  • Prof. Pinaki Sarder, University at Buffalo - The State University of New York, USA
  • Prof. Fabio Dell’ Acqua, University of Pavia, ITALY
  • Dr. Mohammad khaleqi, Shahid Beheshti University, Iran
  • Dr. Ravishankar Dudhe, MAHE, Dubai
  • Prof. Shailendra Mishra, Majmaah University, Saudi Arabia
  • ⁠Prof. Lakshmi Radhakrishnan, AbuDhabi University, UAE
  • ⁠Prof. Prateek Bhatia, Washington State University, USA
  • Prof. Vimal Dwivedi, Ulster University, UK
  • Prof. Vipin Tyagi, JUET, Guna, India
  • ⁠Prof. Divakar Yadav, IGNOU, New Delhi, India
  • Prof. Rajib Mall, IIT Kharagpur, India
  • ⁠Prof. Raghuraj Singh, HBTU, Kanpur, India
  • ⁠Prof. Rajesh Bhatia, PEC, Chandigarh, India
  • Prof. (Dr.) Raghuraj Singh, Professor & Dean, Harcourt Butler Technical University, Kanpur UP
  • Prof.(Dr.) Arun Sharma, Professor and Head, IGDTUW, Delhi
  • Prof. (Dr.) Sailendra Singh, NITTR,Bhopal, M.P.
  • Prof.(Dr.) R.S. Yadav, MNNIT, Allabahad, U.P.
  • Dr. Mahesh Kumar , IIT Patna
  • Prof.(Dr.) D.K. Lobiyal, JNU, New Delhi.
  • Dr. Karan Sing, JNU New Delhi
  • Dr. Tarun Rawat, NSUT, Dwarka
  • Dr. Sapna Katiyar, Advisor (Technology), Impledge Technologies, India
  • Dr. Zeynep Orhan, union College USA
  • Dr. Elton Domnoni, metropolitan univ. Tirana
  • Dr Zafaryab Rasool, Deakin University, Geelong, Victoria, Australia
  • Dr. Ajit Kumar, Soongsil University, Seoul, South Korea
  • Mr. Aman Abidi, Swinburne University of Technology, Melbourne, Victoria
  • Dr. Vibhash Yadav, Rajkiya Engineering College, Banda, U.P. India.
  • Dr. Prabhat Sharma, Harcourt Butler Technical University, Kanpur-208002
  • Dr. Latha banda, JIMS, Greater Noida
  • Dr. Dilip Kumar Yadav, NIT Jamshedpur , India
  • To be updated……

Publishing & Indexing

Accepted and presented papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements


Technically Co-sponsored by




Important Dates

Important Information

Your paper will be excluded from proceedings at any level of quality checks carried out by IEEE. Conference organizers are not responsible if your paper detects plagiarism or any lack in quality reported by IEEE after submission of final proceedings (camera ready copies) to IEEE. Conference organizers are responsible for the technical quality of paper on the basis of reviews obtained. It is sole responsibility of author/s if their paper detects plagiarism even in later stages of quality check. No registration fee will be refunded in any case if your paper is excluded from proceedings by the IEEE.



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